CNMS offers a selection of X-ray diffraction and small-angle scattering techniques to establish crystal structure and morphology. The PANalytical X'Pert MPD Pro is a standard 1. 8 kW secured X-ray tube resource, making use of a Cu target, and upright circle goniometer. This combination usually gives outstanding quality X-ray powder diffraction information over fairly short information collection times. Nonambient example stages: XRK-900, TTK-450 and Phenix Cryostage; Sample spinner with automated sample changer. The PANalytical X'Pert MRD Pro is a standard 1. 8 kW secured X-ray tube resource, using a Cu target, a horizontal circle goniometer and Open Eularian Cradle sample stage. X-ray diffraction measurements for thin films, both single crystals and polycrystalline from RT to 900 C, used to measure powders. Types of capable measurements are crystal orientation, degree of crystallinity, stresses/strain of single crystal thin film, mutual space mapping of example surfaces, thickness and film thickness resolution, Pole number and low angle measurement as low as 0. 1.
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